Experimental Set Up for Low-angle X-ray Scattering System used for the Characterization of Materials

Authors

  • Hussein N.A
  • Shukri A
  • Tajuddin A.A

Abstract

Elastic X-ray scattering at low angles will give rise to diffraction patterns of unique signatures that can be exploited in the identification of various materials. The design criteria for setting up a low angle X-ray scattering system (LAXS) and its parameters of influence will be discussed individually. The LAXS system under construction at the School of Physics, USM, will be introduced.

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Published

26-12-2002