Structural Characterization of SnOâ‚‚ Thick Film Doped with SiC

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Nadira Kamarudin
Mohd Khairi Saidin

Abstract

A series of thick film samples with SnO₂ (active material), SiC (dopant) and ethyl cellulose and propylene glycol (organic binder) have been prepared using screen printing method. The thickness of samples prepared is between 1.10±0.01 µm to 2.36±0.01 µm. X-ray analysis has been done by using Philips PW Diffractometer. The diffraction peak from the X-ray analysis shows the sample have high degree of crystallinity. The lattice constant calculated for each sample shows that the samples produced has a tetragonal structure and the presence of SiC as dopant did not change the structure of SnO₂.

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How to Cite
Kamarudin, N., & Khairi Saidin, M. (2002). Structural Characterization of SnOâ‚‚ Thick Film Doped with SiC. Malaysian Journal of Science, 21, 117–120. Retrieved from https://jupidi.um.edu.my/index.php/MJS/article/view/8870
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Original Articles